SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

תקציר מקורי באנגליתarXiv:2604.26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly. We present SynSur, an end-to-end pipeline for synthetic defect generation and automatic annotation, designed to reduce the manual effort and data scarcity that limit deployed inspection systems. The pipeline combines Vision-Language-Model-based prompt construction, LoRA-adapted diffusion, mask-guided inpainting, metric-based sample filtering, and automatic label derivation. We evaluate SynSur on BSData (pitting defects on ball screw drives) and the scratch subset of MSD, reporting downstream detection performance across YOLOX, YOLOv26, and L