OPD-IAD: From Language Judgment to Industrial Anomaly Detection via On-Policy Self-Distillation

תקציר מקורי באנגליתarXiv:2607.18850v1 Announce Type: cross Abstract: Large vision-language models (LVLMs) have recently shown strong potential for industrial anomaly detection (IAD) by providing image-level anomaly judgments and interpretable defect reasoning. However, current LVLM-based IAD methods still struggle to produce precise pixel-level anomaly maps from generated language judgments. We aim to achieve precise pixel-level localization while using language as guidance rather than letting it dominate the visual response. Specifically, we propose \textbf{OPD-IAD}, an evidence-privileged dense on-policy self-distillation framework for LVLM-based IAD. OPD-IAD distills privileged defect evidence onto the model's own on-policy judgment trajectory, enabling the final generated judgment to be learned under den