A unified self-supervised framework for single-frame Fresnel CDI and overlapped ptychography

תקציר מקורי באנגליתarXiv:2602.21361v4 Announce Type: replace-cross Abstract: Ptychographic imaging at synchrotron and X-ray free-electron laser sources requires densely overlapping scans, which limits throughput and increases dose; extending coherent diffractive imaging to overlap-free operation on extended samples remains an open problem. We present a self-supervised inverse-mapping network for single-frame Fresnel coherent diffraction imaging (CDI) and overlapped ptychography with fixed, pre-estimated probes. The learned neural network reconstructs individual object patches from either one diffraction frame or several overlapping measurements at a time. In single-frame mode, the phase diversity provided by the curved-wavefront probe at the off-focus sample position removes the requirement for overlap const